NPOL > Members > Characterization

Characterization
Chamber Probe Station
Producer : MS Tech
Application : Measuring electrical properties & Gas sensing properties

Probe Station
Producer : MS Tech
Application : Measuring electrical properties

Angle-Dependent Reflectivity Meausrement Setup
Producer : Spectro
Application : Measuring the reflectivity of materials with varying angles

Ellipsometer
Producer : Ellipso Technology
Application : Measuring the refractive index & thickness of film

Optical Microscopy
Producer : OLYMPUS
Application : Magnifying images